XPS tracks the changes caused by the post-processing process of graphite extruded panels
Publish Time: 2024-12-12
After high-temperature treatment, surface modification and other post-processing processes, the internal structure and composition of graphite extruded panels change quietly, and X-ray photoelectron spectroscopy (XPS) is like a keen detective, accurately capturing these dynamic changes.During high-temperature treatment, the thermal motion of carbon atoms in graphite extruded panels intensifies. XPS first focuses on the core energy level peak of the element. As the temperature rises, the C 1s peak position of carbon will shift slightly. This is because high temperature improves the graphite crystal structure, fine-tunes the interlayer spacing, and rearranges the electron cloud distribution, which changes the C 1s binding energy and accurately locates the process of structural ordering from the energy spectrum peak position. At the same time, impurity elements are affected by high temperature, and volatile impurities escape during the temperature rise. XPS detects that the peak intensity of the corresponding element decreases sharply, thereby clarifying the degree of impurity removal. For example, when metal impurity atoms are heated and diffused out of the lattice, the corresponding peak area continues to shrink on the spectrum, intuitively presenting the effect of component purification.The surface modification process introduces new functional groups or atoms. Taking fluorocarbon surface modification as an example, after modification, the F 1s peak appears strongly in the XPS spectrum. Based on its peak area, the fluorine content can be roughly estimated, reflecting the degree of grafting or adsorption. The new functional group changes the surface electronic environment, causing the C 1s peak shape of the adjacent carbon to bifurcate and increase the chemical shift. Through the peak fitting technology, the chemical state proportion of the carbon connected to fluorine is accurately analyzed, and the details of the reconstruction of the surface chemical bond are outlined.For complex multivariate post-processing, XPS uses a deep profiling mode to peel off the surface of graphite extruded panels layer by layer using argon ion sputtering. From the shallow surface to the deep layer, the peak intensity of each element fluctuates in an orderly manner to record the element distribution gradient. If the modifier is concentrated on the surface, its characteristic peak suddenly appears at the beginning of sputtering, and gradually weakens after going deeper; and structural changes such as the internal graphitization process caused by high temperature are presented in the half-height width and symmetry evolution of the deep carbon peak. When the inner graphite crystallite increases, the C 1s peak becomes sharper and more regular. With multi-element, multi-level comprehensive analysis, XPS draws a complete structural composition evolution map of graphite extruded panels from skin to core, providing key data support for optimizing post-processing technology and controlling product quality, and helping to improve the performance of graphite extruded panels in multiple fields such as electronics and energy.
